4. Elemental and X-ray methods

In this section of the course an overview of techniques for characterisation of a materials crystal structure (mineralogical composition) (XRD), major elements and concentrations in materials (XRF, SEM-EDS) and trace element and isotopic ratio composition (ICP-MS and IRMS) will be covered. They are complementary to each other and the limitations of one can be overcome with the other.

 This section is divided into four subsections:

• 4.1. Scanning electron microscopy with energy dispersive spectroscopy (SEM-EDS)
• 4.2. X-ray fluorescence spectroscopy (XRF) and  X-ray diffraction (XRD) analysis
• 4.3. Inductively coupled plasma mass spectrometry (ICP-MS) and Laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS)
• 4.4. Isotope Ratio Mass Spectrometry (IRMS)