TOF-FIB-SIMS

 

Institute of Chemistry at University of Tartu has the capability to perform elemental analysis of solid surfaces and surface defects using a Physical Electronics nanoTOF II FIB-TOF-SIMS. The FIB-TOF-SIMS is an invaluable tool for quality control and defect analysis due to its very high surface sensitivity which is in the order of a few atomic/molecular layers. In addition, the C60 ion source allows studying defects on thin organic layers and films as well as polymer defects and disorderings.

TOF-FIB-SIMS

In addition to atomic layer analysis, the FIB-TOF-SIMS can be used to sputter the surface of the sample using the various ion sources (5kV Ar+, 5kV O-, 30kV C60++) and to construct a depth profile of the sample with sub-nanometer resolution.

In case of macroscopic objects, a depth profile of the chemical composition can be constructed using sequential cutting of the sample using focussed Ga+ ion beam. 200x200 μm cross sections are sequentially analyzed to construct a 3D map of the chemical structure.

It is possible to carry out measurements at different temperatures ranging from −150°C up to 600°C.

Due to the high mass resolution M/ΔM of up to 10,000, the TOF-SIMS can be used to distinguish between the different isotopes of elements, allowing studying of isotope markings of various biological or ionically conductive materials using oxygen-18 or deuterium.

 

 

Services include:

  • Consultation – scientific and technological aspects will be discussed with a client and evaluated whether a given methodology is suitable for solving client problems;
  • Training in the handling of samples;
  • The analysis of samples using TOF-SIMS done by experienced operators;
  • Help in the analysis of the measurement results and if needed, in interpreting them;
  • Development – to work out and implement new methods for solving specific problems using our existing infrastructure;
  • Collaboratory research – to solve more complex scientific or technological problems where a few short-term measurements would give inconclusive results.

 

It is possible to organize training courses for engineers and technicians regarding the different methods of physical characterization of various materials.

 

Contact person: Enn Lust (e-mail: enn.lust@ut.ee)

Operators: Rait Kanarbik, Priit Möller

 

 

 

 

Estonian Research Infrastructures Roadmap object „Center of nanomaterials technologies and research (NAMUR+)” is co-fundeded by European Regional Development Fund (projects „Nanomaterials – research and applications“, 3.2.0304.12-0397, 01.02.2012-31.12.2015 and „Center of nanomaterials technologies and research”, 2014-2020.4.01.16-0123, 01.01.2017-30.06.2022).