{"id":36,"date":"2024-04-04T04:31:17","date_gmt":"2024-04-04T01:31:17","guid":{"rendered":"https:\/\/sisu.ut.ee\/heritage-analysis\/module4\/"},"modified":"2024-07-18T14:35:55","modified_gmt":"2024-07-18T11:35:55","slug":"module4","status":"publish","type":"page","link":"https:\/\/sisu.ut.ee\/heritage-analysis\/module4\/","title":{"rendered":"4. Elemental and X-ray methods"},"content":{"rendered":"<div style=\"height:30px\" aria-hidden=\"true\" class=\"wp-block-spacer\"><\/div>\n\n\n\n<p>In this section of the course an overview of techniques for characterisation of a materials crystal structure (mineralogical composition)<strong> (XRD)<\/strong>, major elements and concentrations in materials <strong>(XRF, SEM-EDS) <\/strong>and trace element and isotopic ratio composition <strong>(ICP-MS and IRMS)<\/strong> will be covered. They are complementary to each other and the limitations of one can be overcome with the other.<\/p>\n\n\n\n<p class=\"has-text-align-center\"><\/p>\n\n\n\n<figure class=\"wp-block-image aligncenter size-full\"><img loading=\"lazy\" decoding=\"async\" width=\"1792\" height=\"787\" src=\"https:\/\/sisu.ut.ee\/wp-content\/uploads\/sites\/285\/Scheme_2.png\" alt=\"\" class=\"wp-image-831\" srcset=\"https:\/\/sisu.ut.ee\/wp-content\/uploads\/sites\/285\/Scheme_2.png 1792w, https:\/\/sisu.ut.ee\/wp-content\/uploads\/sites\/285\/Scheme_2-300x132.png 300w, https:\/\/sisu.ut.ee\/wp-content\/uploads\/sites\/285\/Scheme_2-1024x450.png 1024w, https:\/\/sisu.ut.ee\/wp-content\/uploads\/sites\/285\/Scheme_2-768x337.png 768w, https:\/\/sisu.ut.ee\/wp-content\/uploads\/sites\/285\/Scheme_2-1536x675.png 1536w\" sizes=\"auto, (max-width: 1792px) 100vw, 1792px\"><\/figure>\n\n\n\n<p>\u00a0This section is divided into four subsections:<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li><a style=\"background-color: #ffffff;\" href=\"https:\/\/sisu.ut.ee\/heritage-analysis\/book\/41-sem-eds\">4.1. Scanning electron microscopy with energy dispersive spectroscopy (SEM-EDS)<\/a><\/li>\n\n\n\n<li><a href=\"https:\/\/sisu.ut.ee\/heritage-analysis\/book\/42-xrf\"><span style=\"background-color: #ffffff;\">4.2. X-ray fluorescence spectroscopy (XRF)<\/span>\u00a0and\u00a0<span style=\"background-color: #ffffff;\">\u00a0X-ray diffraction (XRD) analysis<\/span><\/a><\/li>\n\n\n\n<li><a style=\"background-color: #ffffff;\" href=\"https:\/\/sisu.ut.ee\/heritage-analysis\/book\/44-icp-ms-and-la-icp-ms\">4.3. Inductively coupled plasma mass spectrometry (ICP-MS) and Laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS)<\/a><\/li>\n\n\n\n<li><a title=\"\" href=\"https:\/\/sisu.ut.ee\/heritage-analysis\/44-irms\" data-url=\"https:\/\/sisu.ut.ee\/heritage-analysis\/44-irms\">4.4. Isotope Ratio Mass Spectrometry (IRMS)<\/a><\/li>\n<\/ul>\n","protected":false},"excerpt":{"rendered":"<p>In this section of the course an overview of techniques for characterisation of a materials crystal structure (mineralogical composition) (XRD), major elements and concentrations in materials (XRF, SEM-EDS) and trace element and isotopic ratio composition (ICP-MS and IRMS) will be &#8230;<\/p>\n","protected":false},"author":151,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_acf_changed":false,"inline_featured_image":false,"footnotes":""},"class_list":["post-36","page","type-page","status-publish","hentry"],"acf":[],"_links":{"self":[{"href":"https:\/\/sisu.ut.ee\/heritage-analysis\/wp-json\/wp\/v2\/pages\/36","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/sisu.ut.ee\/heritage-analysis\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/sisu.ut.ee\/heritage-analysis\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/sisu.ut.ee\/heritage-analysis\/wp-json\/wp\/v2\/users\/151"}],"replies":[{"embeddable":true,"href":"https:\/\/sisu.ut.ee\/heritage-analysis\/wp-json\/wp\/v2\/comments?post=36"}],"version-history":[{"count":3,"href":"https:\/\/sisu.ut.ee\/heritage-analysis\/wp-json\/wp\/v2\/pages\/36\/revisions"}],"predecessor-version":[{"id":1150,"href":"https:\/\/sisu.ut.ee\/heritage-analysis\/wp-json\/wp\/v2\/pages\/36\/revisions\/1150"}],"wp:attachment":[{"href":"https:\/\/sisu.ut.ee\/heritage-analysis\/wp-json\/wp\/v2\/media?parent=36"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}